PMCL-AC55TS: OMCL-AC55TS Replacement AFM Probe*
The PMCL-AC55TS probe is designed as a direct replacement for the OLYMPUS OMCL-AC55 series microcantilevers, ensuring seamless compatibility with most AFM systems configured for Olympus-type probes. This model features a high resonance frequency in the megahertz range and low thermal noise, enabling high-speed and high-resolution measurements of liquid-solid interfaces.
Key Features
Point-Terminated Tip for High-Resolution Imaging
The tetrahedral probe geometry provides a consistently sharp, point-terminated tip. The apex is further sharpened over more than 1 µm, enabling high-resolution surface imaging.
TipView Alignment Structure
The probe is positioned at the very end of the cantilever, ensuring the tip apex remains fully visible under an optical microscope for accurate positioning.
Low-Resistivity n-Type Doped Silicon
The cantilever is fabricated from n-type doped silicon with very low resistivity (0.01–0.02 Ω·cm). This significantly improves electrical conductivity and allows the probe to be used for electrical measurements such as surface potential mapping and other conductive AFM applications.
Low Thermal Noise for High-Speed, High-Resolution Imaging
With a high resonance frequency and low thermal noise, the PMCL-AC55TS enables high-speed AFM operation with exceptional resolution. It is well suited for advanced material studies, including liquid–solid interface measurements.
Gold/Chromium Reflective Coating
The reflex side of the cantilever is coated with gold-chromium to provide high optical reflectivity for the AFM laser detection system. Gold coatings offer improved chemical stability compared with conventional aluminium coatings and can provide enhanced performance in specialised environments
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*With the discontinuation of OMCL-series AFM probes by Olympus Corporation, Nouveltica provides fully compatible alternatives to ensure continuity in AFM measurements.
See all our OLYMPUS replacement AFM probes: Products
