Surface Topography
Atomic Force Microscopy enables high-resolution mapping of surface morphology at the nanoscale. AFM probes provide precise measurements of surface roughness, step height, and structural features across a wide range of materials, including semiconductors, thin films, polymers, and biological samples
Wafer Structure (1)
Scanning results of wafer structure on a nanometer scale
Wafer Structure (2)
Scanning results of structural bumps on wafer
Optical Lens Examination
Detection of foreign body on optical lens
Micro-lens Structure
Scanning results of micro-lens surface structure
Stainless Plate Structure
Scanning results of topographic structure on stainless plate
Copper Foil Structure
Scanning results of surface structure on copper foil
Polymer Film Structure
Scanning results of topographic structure on polymer film
Thin Film Boundary
Scanning examination of topographic structure on thin film boundary
Related Products
PMCL-AC160TS
• Reflex side aluminium coating
• Resonance Freq. (F): 300 kHz
• Spring Constant (K): 26 N/m
PMCL-AC200TS
• Reflex side aluminium coating
• Resonance Freq. (F): 150 kHz
• Spring Constant (K): 9 N/m
PMCL-AC240TS
• Reflex side aluminium coating
• Resonance Freq. (F): 70 kHz
• Spring Constant (K): 2 N/m