PMCL-AC240TM: OMCL-AC240TM replacement conductive AFM Probe*
The PMCL-AC240TM is a high-performance OMCL-AC240TM replacement conductive AFM probe, designed for tapping mode and non-contact atomic force microscopy, ensuring seamless compatibility with most AFM systems configured for Olympus-type probes. It can be used in a wide range of tapping mode and high-resolution imaging applications, providing reliable performance for surface morphology characteriastion and nanoscale analysis.
Key Features
Point-Terminated Tip for High-Resolution Imaging
The tetrahedral probe geometry provides a consistently sharp, point-terminated tip. The apex is further sharpened over more than 1 µm, enabling high-resolution surface imaging.
TipView Alignment Structure
The probe is positioned at the very end of the cantilever, ensuring the tip apex remains fully visible under an optical microscope for accurate positioning.
Low-Resistivity n-Type Doped Silicon
The cantilever is fabricated from n-type doped silicon with very low resistivity (0.01–0.02 Ω·cm). This significantly improves electrical conductivity and allows the probe to be used for electrical measurements such as surface potential mapping and other conductive AFM applications.
Platinum Coating for Electrical Measurement
The probe features a platinum (Pt) coating on the tip side, enabling excellent electrical conductivity at the tip–sample interface, and makes this probe well suited for conductive AFM (C-AFM), surface potential mapping, and other electrical measurement techniques.
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*With the discontinuation of OMCL-series AFM probes by Olympus Corporation, Nouveltica provides fully compatible alternatives to ensure continuity in AFM measurements.
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