{"id":1304,"date":"2026-03-12T18:34:19","date_gmt":"2026-03-12T18:34:19","guid":{"rendered":"http:\/\/rvokxtc.cluster121.hosting.ovh.net\/?page_id=1304"},"modified":"2026-03-23T02:32:48","modified_gmt":"2026-03-23T01:32:48","slug":"electrical-properties","status":"publish","type":"page","link":"https:\/\/nouveltica.com\/fr\/applications\/electrical-properties\/","title":{"rendered":"Propri\u00e9t\u00e9s \u00e9lectriques"},"content":{"rendered":"
\n\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t
<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t\t

Propri\u00e9t\u00e9s \u00e9lectriques<\/h2>\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
\n\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

Les sondes AFM conductrices permettent la caract\u00e9risation \u00e0 l'\u00e9chelle nanom\u00e9trique des propri\u00e9t\u00e9s \u00e9lectriques, y compris la conductivit\u00e9 locale, la distribution du courant et le potentiel de surface \u00e0 travers les dispositifs semi-conducteurs, les films minces et les mat\u00e9riaux fonctionnels.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t
\n\t\t\t\t\t
\"\"<\/figure>

Voies conductrices de la structure de CI<\/h3>

Cartographie et topographie PeakForce TUNA de la structure de CI<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t\t
\n\t\t
\n\t\t\n\t\t\t\t
\n\t\t\t\t\t

Produits associ\u00e9s<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/a>\n\t\t
\n\t\t\n\t\t\t\t
\n\t\t\t\t\t

PMCL-AC240TM<\/h2>\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

\u2022 Rev\u00eatement d'aluminium face reflex<\/p>

\u2022 Rev\u00eatement de platine c\u00f4t\u00e9 pointe<\/p>

\u2022 Fr\u00e9q. de r\u00e9sonance (F) : 70 kHz<\/strong><\/p>

\u2022 Constante de raideur (K) : 2 N\/m<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

\n\t\t\t\t\t
\n\t\t
\n\t\t\t\t
\n\t\t\t\t\t

Rejoignez-nous d\u00e8s aujourd'hui !<\/h2>\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tS'inscrire<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

Electrical Properties Conductive AFM probes enable nanoscale characterisation of electrical properties, including local conductivity, current distribution, and surface potential across semiconductor devices, thin films, and functional materials. IC Structure Conductive Pathways PeakForce TUNA mapping and topography of IC structure Related Products PMCL-AC240TM \u2022 Reflex side aluminium coating \u2022 Tip side platinum coating \u2022 Resonance Freq. […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":1167,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"elementor_header_footer","meta":{"footnotes":""},"class_list":["post-1304","page","type-page","status-publish","hentry"],"blocksy_meta":[],"_links":{"self":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages\/1304","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/comments?post=1304"}],"version-history":[{"count":0,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages\/1304\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages\/1167"}],"wp:attachment":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/media?parent=1304"}],"curies":[{"name":"WordPress","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}