{"id":1204,"date":"2026-03-12T12:11:39","date_gmt":"2026-03-12T12:11:39","guid":{"rendered":"http:\/\/rvokxtc.cluster121.hosting.ovh.net\/?page_id=1204"},"modified":"2026-03-23T02:32:16","modified_gmt":"2026-03-23T01:32:16","slug":"surface-topography","status":"publish","type":"page","link":"https:\/\/nouveltica.com\/fr\/applications\/surface-topography\/","title":{"rendered":"Topographie de surface"},"content":{"rendered":"
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Topographie de surface<\/h2>\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t
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La microscopie \u00e0 force atomique permet une cartographie haute r\u00e9solution de la morphologie de surface \u00e0 l'\u00e9chelle nanom\u00e9trique. Les sondes AFM fournissent des mesures pr\u00e9cises de la rugosit\u00e9 de surface, de la hauteur de marche et des caract\u00e9ristiques structurelles sur une large gamme de mat\u00e9riaux, y compris les semi-conducteurs, les films minces, les polym\u00e8res et les \u00e9chantillons biologiques.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t

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Structure de tranche (1)<\/h3>

R\u00e9sultats de balayage de la structure de tranche \u00e0 l'\u00e9chelle nanom\u00e9trique<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t

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Structure de tranche (2)<\/h3>

R\u00e9sultats de balayage des bosses structurelles sur la tranche<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t

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Examen de lentille optique<\/h3>

D\u00e9tection de corps \u00e9tranger sur lentille optique<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t

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Structure de micro-lentille<\/h3>

R\u00e9sultats de balayage de la structure de surface de micro-lentille<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Structure de plaque en acier inoxydable<\/h3>

R\u00e9sultats de balayage de la structure topographique sur plaque en acier inoxydable<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t

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Structure de feuille de cuivre<\/h3>

R\u00e9sultats de balayage de la structure de surface sur feuille de cuivre<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t

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Structure de film polym\u00e8re<\/h3>

R\u00e9sultats de balayage de la structure topographique sur film polym\u00e8re<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t

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Limite de film mince<\/h3>

Examen par balayage de la structure topographique \u00e0 la limite du film mince<\/p><\/div><\/div>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Produits associ\u00e9s<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/a>\n\t\t
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PMCL-AC160TS<\/h2>\t\t\t\t<\/div>\n\t\t\t\t
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\u2022 Rev\u00eatement d'aluminium face reflex<\/p>

\u2022 Fr\u00e9q. de r\u00e9sonance (F) : 300 kHz<\/strong><\/p>

\u2022 Constante de raideur (K) : 26 N\/m<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/a>\n\t\t\n\t\t\t\t

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PMCL-AC200TS<\/h2>\t\t\t\t<\/div>\n\t\t\t\t
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\u2022 Rev\u00eatement d'aluminium face reflex<\/p>

\u2022 Fr\u00e9q. de r\u00e9sonance (F) : 150 kHz<\/strong><\/p>

\u2022 Constante de raideur (K) : 9 N\/m<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/a>\n\t\t\n\t\t\t\t

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PMCL-AC240TS<\/h2>\t\t\t\t<\/div>\n\t\t\t\t
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\u2022 Rev\u00eatement d'aluminium face reflex<\/p>

\u2022 Fr\u00e9q. de r\u00e9sonance (F) : 70 kHz<\/strong><\/p>

\u2022 Constante de raideur (K) : 2 N\/m<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t

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Rejoignez-nous d\u00e8s aujourd'hui !<\/h2>\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t\t\n\t\t\t\t\t\t\n\t\t\t\t\t\t\t\t\tS'inscrire<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>","protected":false},"excerpt":{"rendered":"

Surface Topography Atomic Force Microscopy enables high-resolution mapping of surface morphology at the nanoscale. AFM probes provide precise measurements of surface roughness, step height, and structural features across a wide range of materials, including semiconductors, thin films, polymers, and biological samples Wafer Structure (1) Scanning results of wafer structure on a nanometer scale Wafer Structure […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":1167,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"elementor_header_footer","meta":{"footnotes":""},"class_list":["post-1204","page","type-page","status-publish","hentry"],"blocksy_meta":[],"_links":{"self":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages\/1204","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/comments?post=1204"}],"version-history":[{"count":0,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages\/1204\/revisions"}],"up":[{"embeddable":true,"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/pages\/1167"}],"wp:attachment":[{"href":"https:\/\/nouveltica.com\/fr\/wp-json\/wp\/v2\/media?parent=1204"}],"curies":[{"name":"WordPress","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}